24 novembre 2021 -
26 novembre 2021 / Dübendorf

Formation

2021 Advanced Course: Advanced X-Ray Diffraction Methods for Coatings: Strain, Defects and Deformation Analysis of Thin Films

Understanding the structure of thin films will improve their fabrication. After introducing basic thin film and HR-XRD characterisation methods, fundamental theory and limitations will be discussed including examples of films in applications and how their structures influence characteristics.

Real samples will be measured. In-house protocols will be presented for establishing reproducible and reliable measurements, and for interpreting stress/strain and materials defect levels.

 

Topics

  • Introduction to different X-Ray techniques
  • Relationships between physical and structural properties
  • High resolution X-Ray techniques
  • Coherent and non-coherent scattering
  • Texture and stress
  • Coatings case studies
  • Examples of successful technology transfers using X-ray techniques

organisateur

EPFL-École polytechnique fédérale de Lausanne

date

24 novembre 2021 -
26 novembre 2021

Lieu

Empa
Eduard-Amstutz-Strasse, Dübendorf
Suisse

Contacts

carey.sargent@epfl.ch